- J.Y. Shung, K.Y.-J. Hsu, Y.-L. Jiang, and C.J. Tsai, "Design Issues of Two-Dimensional Amorphous Silicon Position-Sensitive Detectors", Thin Solid Films 337, 226 (1999).
- S.L. Cheng, H.Y. Huang, Y.C. Peng, L.J. Chen, B.Y. Tsui, C.J. Tsai, S.S. Guo, Y.R. Yang, and J.T. Lin, "Formation of TiSi2 Thin Films on Stresses (001) Si Substrates", Applied Surface Science 142, 295(1999).
- S.L. Cheng, H.Y. Huang, Y.C. Peng, L.J. Chen, B.Y. Tsui, C.J. Tsai, S.S. Guo, Y.R. Yang, and J.T. Lin, "Effects of Stress on the Growth of TiSi2 Thin Films on (001) Si", Appl. Phys. Lett. 74, 1406 (1999).
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- C.J. Tsai, P.L. Chung, and K.H. Yu, "Stress evolution of Ni/Pd/Si reaction system under isochronal annealing"; accepted to be published in Thin Solid Films (2000).